Digital Scanning Electron Microscope EM 3200 is the industry's leading low-vacuum scanning electron microscope (SEM) platform with high-resolution capabilities using thermal emission electron optics.
While the low-vacuum settings are particularly useful for inspection and characterization of non-conductive and heavily contaminated materials, the system also minimizes sample preparation complexity for charge-free imaging and analysis.
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| Parasitic ovum |
Metal section |
Inorganic membrane |
Resolution
6.0nm (Tungsten filament)
Magnification
15 - 250,000
Electron Optical System
Electron gun: Tungsten emitter
Accelerating voltage: 0_30kV
Lens system: Three electron magnetic lens system
Objective lens aperture: Three apertures selectable
Specimen Chamber
Six ports for WDS, EDS, BSE detectors and other attachment installation
Specimen Stage
Standard stage Displacement: X and Y lateral motions 50mm,Z
motion 25mm,tilt -5__+90_,360_continuous rotation
Large stage Displacement: X lateral motion 80mm,Y lateral
motion 50mm,Z motion 30mm,tilt 0__+90_, 360_continuous rotation
Computer System
PC compatible, Microsofttm WindowstmXP operation system
Operate And Control Software
The brand new design operate software, SEM control by using
keyboard and mouse only. Versatile automatic function. Parameters
of SEM operation can be stored and easily managed.
Image Display
Digital image,1024_768 frame and display resolution
Scanning mode: Full frame, plane, line, spot, selected area dual
magnification and screen split
17-inch colour viewing monitor
Image Processing And Analyzing
Image enhancement, Threshold transformation,Particle statistic
analysis, Morphology transformation, Gray level histogram display
and Pseudo-colour transform for gray scale image
Image Output And Record
Versatile image document formats, support digital monochrome
printer and versatile print-out equipments with standard interface
Vacuum System
Fully automatic high speed diffusion pump vacuum system (Turbo
molecular pump optional)
IMAGE PROCESSING
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| SEM operating interface |
SEM particle analysis |
SEM color segmentation |
SEM pseudo-color
transform |
SEM brightness/
contrast adjustment |
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Electron Microscope 
